Quality - Measurement tools
FISCHERSCOPE® X-RAY - sistema XDL
The FISCHERSCOPE® X-RAY XDL system measures the thickness of any galvanic coating, determines the proportion of the constituents of an alloy coating or analyzes the materials using the X-ray fluorescence method according to DIN 50987 and ISO 3497. The measurement is non-destructive, it is fast and can be performed on a surface of minimum width.
The voluminous cell with lateral slits, its measuring device from above and the great flexibility in positioning the pieces make it extremely easy to use. The software running under Windows® 95 is installed on a separate PC. The color monitor has the dual function of displaying the measurements and results, and displaying the piece to be measured. These are the visible elements and characteristics of the FISCHERSCOPE® X-RAY XDL system.
The system uses a totally new method for calculating thicknesses. Even in the presence of the most complex current combinations, the XDL system can be calibrated in a very simple way, even without reference standards, by previously indicating the measurement accuracy.
The DCM (Distance Controlled Measurement), an ingenious method, corrects the calibration through the optical control of the measuring distance, simplifying the measurement of parts with complex geometry.